NCFlexE

Facilities available @ NCFlexE Centre

Building and Infrastructure

○ Over 5000+ square meter area with state-of-the-art facilities and equipment.
○ Over 700 square meter Cleanroom area.
○ One stop solution for flexible electronics.

Printing Infrastructure

Printing facilities for Semiconductor device fabrication

○ Sheet-to-sheet printing
○ Roll-to-roll printing

Processing & Characterisation

Complete set of processing equipment including evaporators, sputtering, PECVD, RIE and DRIE for inorganic material processing

Simulation Facility

Prototype

Collaboration Floor

○ Dedicated place for industry partners/collaborators
○ Office & lab space for incubation

One stop solution for flexible electronics

General Facilities
Supporting Facilities
Vacuum Processing Facilities

○ Unique TFT fabrication facility.

○ Unique OLED fabrication facility.

Printing Facilities

Stand alone slot-die, gravure, flexo, rotary screen, inkjet and bioprinter. Also multi-station roll- to- roll coaterswith interchangeable printing heads in a clean room.

For Hybrid processes

Lithography (including nano and imprint), roll to roll sputter, evaporation, CVD, ALD, laser ablation, OLED cluster tool, PV cell fabrication tools in glove box, laser patterning in a clean room.

Chemical Laboratory

Fully functional chemical synthesis facility with chemical characterization tools and ink development facility equipped with tools such as viscometer, rheometer and contact angle measurement system.

Modeling and Simulations Laboratory

Equipped with workstations and most commonly used design tools, such as Inventor, Solidedge, Solidworks and TCAD tools.

Electrical Measurements

CV, parameter analyzer, solar simulator, IPCE, probe station, test station (various electrical sources and meters), reliability tester, electronics component laboratory and oscilloscopes.

Chemical and Materials Characterization

GPC, MALDI-TOF mass spectrometer, UV-VIS-NIR spectrophotometer, FTIR, liquid chromatography, dynamic light scattering, TGA. PL, TRPL, AFM, ellipsometer, kelvin probe, FESEM, cyclic voltammetry, electrochemical impedance spectroscopy.

Infrastructure